Laser anneal induced effects on the NBTI degradation of advanced process 45nm high-k pMOS
NBTI degradation effect on advanced-process 45nm high- k PMOSFETs with geometric and process variations
Reliability study of 90nm CMOS inverter
Effect of oxide thickness on 32nm pMOSFET reliability
UHF RFID Tag Design to achieve Lower Power Consumption
Study on Analog Front End of Passive UHF RFID Transponder
